The second half of twentieth century has seen some of the most important developments in chemical analysis in geology and geochemistry. Based on the well-known physical rules that drive the behavior of particles and rays, recent technological advances have created opportunities for new developments based on microbeams : Electrons, ions, protons, neutrons, X-rays, IR to UV lights including laser. This session invites contributions describing and applying the latest developments in Electron Probe Micro Analyzer (EPMA), Scanning Electron Microscopy (SEM), Secondary Ion Mass Spectrometry (SIMS), Proton-Induced X-ray Emission (PIXE), Laser Ablation – Inductively Coupled Plasma Mass Spectrometry (LA-ICPMS), Raman and Infrared spectrometry, synchrotron based technics and others, in the contest of geological materials.

We encourage contributions that highlight new protocols and technical improvements, as well as original works based on the combination of different techniques.