Determining snow material properties from near-infrared photography
- 1WSL Institute for Snow and Avalanche Research SLF, Davos Dorf, Switzerland (lars.mewes@slf.ch)
- 2Davos Instruments AG, Davos Platz, Switzerland
It is well understood that snow is a complex, porous material, whose microstructural changes directly affect its physical properties. Therefore, – to gauge the snow's role within the climate system – it is of interest to accurately measure and characterize the spatio-temporal variability of snow surfaces and snowpacks.
On a local scale, for example inside a snowpit during a field campaign, snow measurements are often taken in a manual, point-like fashion resulting in single, one-dimensional profiles with a sampling resolution of a few centimeters. At this resolution thin layers are difficult to observe and spatial inhomogeneities of the snowpack are missed. State-of-the-art X-ray microtomography (μ‑CT) scans of snow provide excellent spatial resolution,1 however, the added experimental constraints prevent sampling extended spatio-temporal domains.
To address some of these limitations, we propose to use near-infrared (NIR) photography2 with 940 nm illumination to determine the snow's specific surface area (SSA) and density. Our device – called SnowImager – achieves millimeter resolution and covers a spatial extent of a few square meters, such as the surface area of a snowpit wall. While the SSA is determined directly from the measured NIR image using the well-established asymptotic radiation transfer theory,3–6 the density dependence is introduced by physically truncating the illuminating and back-scattered light. It results non-trivially from the lateral component of the sub-surface scattering process and enables us to recover density profiles that compare well to reference data from density cutter and μ‑CT measurements. As a demonstration, we present the spatial variability of an Antarctic snowpack at an unprecedented level of detail, revealing an extremely high spatial variability of the snow microstructure.
Using near-infrared photography enables accurate and fast determination of snow material properties, whenever millimeter spatial resolution and a spatial extent of several square meters are required. It is thus ideally suited to simultaneously capture thin layers within the snowpack and spatial inhomogeneities over a centimeter to meter scale, which is relevant as ground truth measurement for climate research, remote sensing and avalanche forecasting among others.
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5. Kokhanovsky, A. A. & Zege, E. P., Appl. Opt. 43, 1589–1602 (2004).
6. Libois, Q. et al., The Cryosphere 7, 1803–1818 (2013).
How to cite: Mewes, L., Walter, B., Buchli, J., Büchel, V., Suter, M., Schneebeli, M., and Löwe, H.: Determining snow material properties from near-infrared photography, EGU General Assembly 2024, Vienna, Austria, 14–19 Apr 2024, EGU24-17505, https://doi.org/10.5194/egusphere-egu24-17505, 2024.