3rd International Conference on Tomography of Materials and Structures 26–30 June 2017 Lund, Sweden

Oral programme 1

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Track details
Oral programme
 / Tue, 27 Jun, 10:00–12:00 / 14:30–17:30 / Room Stora Salen
Poster programme
 / Attendance Wed, 28 Jun, 16:10–18:30 / Poster area
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Tuesday, 27 Jun 2017
Room Stora Salen
10:00–10:20
ICTMS2017-10
In situ nanotomography at ID16B ESRF beamline
Villanova Julie, Kumar richi, Daudin Rémi, Lhuissier Pierre, Salvo Luc, Jauffrès David, Martin Christophe, Martinez-Criado Gema, and Tucoulou Rémi
10:20–10:40
ICTMS2017-70
Bimodal imaging with neutrons and X-rays
Anders Kaestner, Chiara Carminati, Daniil Kazantsev, Jan Hovind, Peter Vontobel, and Eberhard Lehmann
10:40–11:00
ICTMS2017-93
Combining tomography and diffraction at PSICHE beamline of Synchrotron SOLEIL
Andrew King, Nicolas Guignot, Eglantine Boulard, Jean-Pierre Deslandes, Jean-Paul Itié, Jiayi Li, and Loïc Bertrand
11:00–11:20
ICTMS2017-192
Simultaneous 4D X-ray radioscopy/tomography and energy dispersive diffraction at the EDDI beamline
Francisco García-Moreno, Catalina Jiménez, Paul H Kamm, Manuela Klaus, and John Banhart
11:20–11:40
ICTMS2017-98
Mapping Grain Morphology and Grain Orientations by Laboratory Diffraction Contrast Tomography
Nicolas Gueninchault, Florian Bachman, Christian Holzner, Hrishikesh Bale, Kenneth K. Nielsen, Leah Lavery, and Erik Lauridsen
11:40–12:00
ICTMS2017-211
Combined 3D chemical and morphological characterization using an integrated system
Matthieu N. Boone, Brecht Laforce, Bert Masschaele, David Schaubroeck, Manuel Dierick, Veerle Cnudde, Bart Vekemans, Luc Van Hoorebeke, and Laszlo Vincze
Lunch break
14:30–14:50
ICTMS2017-109
Integrated Imaging in Three Dimensions: The Sum is Greater than the Parts
Ashwin Shahani, Hrishikesh Bale, Nicolas Gueninchault, Arno Merkle, and Erik Lauridsen
14:50–15:10
ICTMS2017-159
Development of speckle based X-ray imaging
Helene Labriet, Emmanuel Brun, Barbara Fayard, Sylvain Bohic, and Sebastien Berujon
15:10–15:30
ICTMS2017-53
On the use of image correlation for stabilization purposes in a SEM-based X-ray tomography system
Luis Agnaldo Gomes Perini, Pierre Bleuet, Jorge Filevich, Bart Buijsse, Laurens Kwakman, and William Parker
15:30–15:50
ICTMS2017-190
Towards One Hertz Electron Tomography Of Dynamic Processes Under Environmental Conditions: Expectations And Limitations Due To Blur Effects
Hussein Banjak, Thomas Grenier, Voichita Maxim, Siddardha Koneti, Lucian Roiban, and Thierry Epicier
Coffee break
16:10–16:30
ICTMS2017-162
GigaFRoST – A High-speed Camera Readout System for Ultrafast Tomography at Sustained kHz Frame Rates
Christian Schlepütz, Rajmund Mokso, Gerd Theidel, Heiner Billich, Elmar Schmid, Tine Celcer, Gordan Mikuljan, Federica Marone, Niklaus Schlumpf, and Marco Stampanoni
16:30–16:50
ICTMS2017-152
Evaluation of the absorbed dose in X-ray microtomography
Amelie De Muynck, Stijn Bonte, Jelle Dhaene, Manuel Dierick, Matthieu Boone, Klaus Bacher, and Luc Van Hoorebeke
16:50–17:10
ICTMS2017-57
Dynamic in-situ 4D measurement in a lab tomograph
Clément Jailin, Ante Buljac, Amine Bouterf, Martin Poncelet, and Stéphane Roux
17:10–17:30
ICTMS2017-69
Correlated 3D Imaging of Dislocations: Insight into the Onset of Thermal Slip in Semiconductor Wafers
Daniel Hänschke, Elias Hamann, Simon Bode, Andreas Danilewsky, Lukas Helfen, and Tilo Baumbach