1 Acquisition |
Oral programme
/ Tue, 27 Jun, 10:00–12:00
/ 14:30–17:30
/ Room Stora Salen
Poster programme
/ Attendance Wed, 28 Jun, 16:10–18:30
/ Poster area
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Tuesday, 27 June 2017 Room Stora Salen |
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10:00–10:20 |
ICTMS2017-10
In situ nanotomography at ID16B ESRF beamline Villanova Julie, Kumar richi, Daudin Rémi, Lhuissier Pierre, Salvo Luc, Jauffrès David, Martin Christophe, Martinez-Criado Gema, and Tucoulou Rémi |
10:20–10:40 |
ICTMS2017-70
Bimodal imaging with neutrons and X-rays Anders Kaestner, Chiara Carminati, Daniil Kazantsev, Jan Hovind, Peter Vontobel, and Eberhard Lehmann |
10:40–11:00 |
ICTMS2017-93
Combining tomography and diffraction at PSICHE beamline of Synchrotron SOLEIL Andrew King, Nicolas Guignot, Eglantine Boulard, Jean-Pierre Deslandes, Jean-Paul Itié, Jiayi Li, and Loïc Bertrand |
11:00–11:20 |
ICTMS2017-192
Simultaneous 4D X-ray radioscopy/tomography and energy dispersive diffraction at the EDDI beamline Francisco García-Moreno, Catalina Jiménez, Paul H Kamm, Manuela Klaus, and John Banhart |
11:20–11:40 |
ICTMS2017-98
Mapping Grain Morphology and Grain Orientations by Laboratory Diffraction Contrast Tomography Nicolas Gueninchault, Florian Bachman, Christian Holzner, Hrishikesh Bale, Kenneth K. Nielsen, Leah Lavery, and Erik Lauridsen |
11:40–12:00 |
ICTMS2017-211
Combined 3D chemical and morphological characterization using an integrated system Matthieu N. Boone, Brecht Laforce, Bert Masschaele, David Schaubroeck, Manuel Dierick, Veerle Cnudde, Bart Vekemans, Luc Van Hoorebeke, and Laszlo Vincze |
Lunch break
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14:30–14:50 |
ICTMS2017-109
Integrated Imaging in Three Dimensions: The Sum is Greater than the Parts Ashwin Shahani, Hrishikesh Bale, Nicolas Gueninchault, Arno Merkle, and Erik Lauridsen |
14:50–15:10 |
ICTMS2017-159
Development of speckle based X-ray imaging Helene Labriet, Emmanuel Brun, Barbara Fayard, Sylvain Bohic, and Sebastien Berujon |
15:10–15:30 |
ICTMS2017-53
On the use of image correlation for stabilization purposes in a SEM-based X-ray tomography system Luis Agnaldo Gomes Perini, Pierre Bleuet, Jorge Filevich, Bart Buijsse, Laurens Kwakman, and William Parker |
15:30–15:50 |
ICTMS2017-190
Towards One Hertz Electron Tomography Of Dynamic Processes Under Environmental Conditions: Expectations And Limitations Due To Blur Effects Hussein Banjak, Thomas Grenier, Voichita Maxim, Siddardha Koneti, Lucian Roiban, and Thierry Epicier |
Coffee break
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16:10–16:30 |
ICTMS2017-162
GigaFRoST – A High-speed Camera Readout System for Ultrafast Tomography at Sustained kHz Frame Rates Christian Schlepütz, Rajmund Mokso, Gerd Theidel, Heiner Billich, Elmar Schmid, Tine Celcer, Gordan Mikuljan, Federica Marone, Niklaus Schlumpf, and Marco Stampanoni |
16:30–16:50 |
ICTMS2017-152
Evaluation of the absorbed dose in X-ray microtomography Amelie De Muynck, Stijn Bonte, Jelle Dhaene, Manuel Dierick, Matthieu Boone, Klaus Bacher, and Luc Van Hoorebeke |
16:50–17:10 |
ICTMS2017-57
Dynamic in-situ 4D measurement in a lab tomograph Clément Jailin, Ante Buljac, Amine Bouterf, Martin Poncelet, and Stéphane Roux |
17:10–17:30 |
ICTMS2017-69
Correlated 3D Imaging of Dislocations: Insight into the Onset of Thermal Slip in Semiconductor Wafers Daniel Hänschke, Elias Hamann, Simon Bode, Andreas Danilewsky, Lukas Helfen, and Tilo Baumbach |