Snow cover characteristics (e.g., spatial distribution, surface and internal physical properties) are continuously evolving over a wide range of scales due to meteorological conditions, such as precipitation, wind, and radiation.
Most processes occurring in the snow cover depend on the vertical and horizontal distribution of its physical properties, which are primarily controlled by the microstructure of snow (e.g., density and specific surface area). In turn, snow metamorphism changes the microstructure, leading to feedback loops that affect the snow cover on coarser scales. This can have far-reaching implications for a wide range of applications, including snow hydrology, weather forecasting, climate modelling, avalanche hazard forecasting, and the remote sensing of snow. The characterization of snow thus demands synergetic investigations of the hierarchy of processes across the scales, ranging from explicit microstructure-based studies to sub-grid parameterizations for unresolved processes in large-scale phenomena (e.g., albedo and drifting snow).
This session is therefore devoted to modelling and measuring snow processes across scales. The aim is to gather researchers from various disciplines to share their expertise on snow processes in seasonal and perennial snowpacks. We invite contributions ranging from “small” scales, as encountered in microstructure studies, over “intermediate” scales typically relevant for 1D snowpack models, up to “coarse” scales, that typically emerge for spatially distributed modelling over mountainous or polar snow- and ice-covered regions. Specifically, we welcome contributions reporting results from field, laboratory, and numerical studies of the physical and chemical evolution of snowpacks. We also welcome contributions reporting statistical or dynamic downscaling methods of atmospheric driving data, assimilation of in-situ and remotely sensed observations, representation of sub-grid processes in coarse-scale models, and evaluation of model performance and associated uncertainties.