Deep electrical structure and geological significance of &nbsp;Beishan Orogenic Belt, Southern CAOB

Chang'an Guo; Lingxiao Zhang; Chutong Chen; Weiheng Yuan

doi:https://doi.org/10.5194/egusphere-egu25-14471

[Back] [Session EMRP2.4]

EGU25-14471, updated on 15 Mar 2025

https://doi.org/10.5194/egusphere-egu25-14471

EGU General Assembly 2025

© Author(s) 2025. This work is distributed under
the Creative Commons Attribution 4.0 License.

Deep electrical structure and geological significance of Beishan Orogenic Belt, Southern CAOB

Chang'an Guo^1,2, Lingxiao Zhang^1,2, Chutong Chen^1,2, and Weiheng Yuan^1,2

Chang'an Guo et al.

¹Center for Geophysical Survey, China Geological Survey, Langfang, Hebei 065000, China
²Technology Innovation Center for Earth Near Surface Detection, China Geological Survey, Langfang, Hebei 065000 210023, China

How to cite: Guo, C., Zhang, L., Chen, C., and Yuan, W.: Deep electrical structure and geological significance of Beishan Orogenic Belt, Southern CAOB, EGU General Assembly 2025, Vienna, Austria, 27 Apr–2 May 2025, EGU25-14471, https://doi.org/10.5194/egusphere-egu25-14471, 2025.

This abstract has been withdrawn on 25 Jul 2025.